Jmm-al10 Test Point | GENUINE |

Step 1: Device Disassembly To access the test point on the JMM-AL10, you must partially disassemble the phone.

Step 2: Locating the Test Point On Kirin-based Huawei devices like the JMM-AL10, the test point is located on the mainboard.

Step 3: Shorting the Point

Step 4: PC Detection

Step 5: Flashing / Repair

is the Chinese variant of the Huawei Honor V9 Play (also known as the Honor 6C Pro in international markets). It is powered by the MediaTek MT6750 DeviceAtlas In mobile repair, a test point

is used to force the device into a special low-level mode (such as

for MediaTek devices) when the standard boot sequence fails or when you need to perform actions like FRP bypass, bootloader unlocking, or unbricking. 1. Preparation and Disassembly

To access the test point, you must partially disassemble the phone to reach the motherboard. Tools Needed

: SIM ejector tool, Pentalobe (0.8mm) and Phillips (1.5mm) screwdrivers, and a pair of fine-tipped tweezers. : Remove the SIM/SD card tray.

: Unscrew the bottom Pentalobe screws and carefully pry off the back cover. jmm-al10 test point

: The fingerprint sensor is attached to the motherboard via a fragile flex cable; do not pull the back cover away too quickly. Disconnect this cable first. : Disconnect the battery connector to prevent short circuits during the process. 2. Locating the JMM-AL10 Test Point

Because the JMM-AL10 is a MediaTek-based device, the test point procedure typically involves grounding a specific pin on the motherboard while connecting the USB cable to a PC.

: On the motherboard, look for a small copper circular pad (often labeled as "KOLO" or located near the CPU/EMMC shielding).

: You must use tweezers to short this specific pad to any metal shield or "GND" (Ground) on the motherboard. 3. Entering BROM/Download Mode

Once the battery is disconnected and the test point is identified: Huawei Honor V9 Play (JMM-AL10) - DeviceAtlas Huawei Honor V9 Play (JMM-AL10) | DeviceAtlas. DeviceAtlas

Before you begin, gather the following tools:

Standard flashing via the SD Card (dload method) or standard Fastboot/Recovery mode is not always sufficient. The Test Point method is required in the following scenarios:

The JMM-AL10 test point is an accessible diagnostic pad on Huawei devices (commonly Mate/Enjoy series) used for low-level troubleshooting: boot mode entry, USB flashing, and serial communication. Technicians and advanced users use it to recover bricked phones, access firmware via EDL/fastboot, or read logs via UART.

The JMM-AL10 is a Huawei smartphone model (marketed variously as Honor 7 Lite or Y7 Prime 2017) running on Huawei’s proprietary Kirin chipset. In the context of mobile software repair and firmware flashing, the Test Point (often referred to as "Kirin Test Point" or "Emergency Mode") is a hardware technique used to force the device into a deep emergency download mode.

This mode bypasses the standard bootloader checks, allowing technicians to unbrick the device, downgrade firmware, or flash firmware files (APP, MODEM, CUST) via specialized tools like SigmaKey, Octoplus, or SP Multi-Port Download Tool. Step 1: Device Disassembly To access the test

  • Connect USB: While maintaining the short, plug the USB cable into the phone.
  • Release the Short: After 2-3 seconds, release the tweezers.
  • Check PC Detection: The PC should now detect the device as “Huawei USB COM 1.0” (or a COM port number). In IDT, the port should turn yellow.
  • Start Flashing: Click “Start” in IDT. The tool will write the Bootloader, Boot, Recovery, System, and Cust partitions.

    • The test point on the Huawei JMM-AL10 (Honor 9 Lite) is a last-resort, hardware-level backdoor for forced download mode. It is an essential tool for professional repair technicians to recover bricked devices, bypass FRP locks, or restore corrupted baseband data. It is not intended for casual use due to the risk of permanent physical damage. If your device is under warranty or functional enough to enter fastboot/recovery mode, those software-based paths are safer and preferable.

    The Huawei JMM-AL10 (marketed as the Honor V9 Play or Honor 6C Pro) is a MediaTek-based smartphone released in 2017. For technicians and advanced users, the "test point" is a critical hardware feature used to force the device into a low-level BootROM/Preloader mode. This mode allows for deep system repairs, such as unbricking a "dead" device, bypassing Factory Reset Protection (FRP), or flashing firmware when standard software methods fail. Hardware Specifications Model: JMM-AL10 (China version). Chipset: MediaTek MT6750.

    Operating System: Originally shipped with Android 7.0 (Nougat) and EMUI 5.1.

    Common Variants: JMM-AL00, JMM-TL00, JMM-TL10, and JMM-L22 (EMEA). Understanding the JMM-AL10 Test Point

    A test point on the JMM-AL10 consists of small metal pads on the motherboard. Shorting these pads to the ground (GND) while connecting the device to a computer triggers a hardware-level override.

    Primary Function: Forcing the device into MediaTek USB Port (VCOM) mode. Use Cases:

    FRP Bypass: Removing Google Account locks after a factory reset.

    Unbricking: Repairing devices stuck in a boot loop or with a "black screen" (dead boot).

    Firmware Flashing: Writing raw system files directly to the eMMC storage. Location and Procedure

    The test points for the JMM-AL10 are located under the back cover, requiring careful disassembly of the phone. Step 2: Locating the Test Point On Kirin-based

    Disassembly: Power off the device and remove the back panel to expose the motherboard.

    Locating Pads: Look for a cluster of test points near the battery connector or the CPU shielding. Note that while modern tools like UnlockTool provide specific diagrams, users often have to short a specific pad to a nearby ground (like a metal shield).

    Connection: Use tweezers to bridge (short) the test point pad to the ground while simultaneously plugging in the USB cable connected to a PC.

    Verification: The PC should detect a new device under Ports (COM & LPT) as "MediaTek USB Port". Alternative Methods

    is the Chinese variant of the Huawei Honor V9 Play (also known internationally as the Honor 6C Pro ). It is powered by the MediaTek MT6750

    processor. Test points on this device are primarily used by technicians to force the phone into a specific "Flash Mode" (MTK Preloader/BROM mode) to bypass Factory Reset Protection (FRP), remove Huawei IDs, or repair a "dead boot" when the device is software-bricked. m.sunsky-online.com 1. Hardware Context & Test Point Usage

    Shorting the test point to ground (GND) allows service software like UnlockTool

    to communicate with the MediaTek chipset before the system boots, enabling low-level flashing or partition erasing. Key Operations: FRP Bypass: Removing Google or Huawei account locks. Huawei ID Removal: Unlinking the device from a lost account. Dead Boot Repair: Reflashing the device when it does not power on normally. 2. Technical Specifications (JMM-AL10) Model Name Huawei Honor V9 Play / Honor 6C Pro MediaTek MT6750 Octa Core 4GB RAM + 32GB Storage (China Version) Android 7.0 (EMUI 5.x) 3. Procedure for Using Test Points

    To access the test points, the device must be partially disassembled: